返回首頁
 
[ 原子力顯微鏡| NT-MDT SPECTRA ]
prima therma aura maximus solaris vita toma spectra
aura

Only NTEGRA Spectra provides fully technical integrated with Renishaw spectrometer solution in terms of software, hardware, and concept for interdisciplinary science at the molecular level. As a result of such union, researcher can obtain optimum efficiency and more time for investigations which allow to focus on data collection and analysis. So it is safe to say: real integration is better than just a combination.

NTEGRA Spectra nanolaboratory is a system that combines confocal scanning laser spectrometer, optical microscope and universal scanning probe microscope. The system is capable of working in the mode of registration of spatial 3D distribution of luminescence spectrum and Raman light scattering, as well as various scanning probe microscopy modes that include nanoindentation, nanomanipulation and nanolithography.

01 02 03
Upright
Inverted
Side illumination
  • Atomic Force Microscopy ( > 30 modes )
  • Confocal Raman / Fluorescence / Rayleigh Microscopy
  • Scanning Near-Field Optical Microscopy ( SNOM / NSOM )
  • Optimized for Tip Enhanced Raman and Fluorescence (TERS, TEFS, TERFS) and scattering SNOM (s-SNOM)
Modes:
  • AFM (mechanical, electrical, magnetic properties, nanomanipulation etc.)
  • White Light Microscopy and Confocal Laser (Rayleigh) Imaging
  • Confocal Raman Imaging and Spectroscopy
  • Confocal Fluorescence Imaging and Spectroscopy
  • Scanning Near-Field Optical Microscopy ( SNOM / NSOM )
  • Tip Enhanced Raman and Fluorescence Microscopy (TERS, TEFS, TERFS)
Controlled environment:
  • Temperature
  • Humidity
  • Gases
  • Liquid
  • Electrochemical environment
  • External magnetic field
  • 1
  • techmical
  • 03
  • 04
  • 04
Inverted setup: Upright setup:
  • Optimized for transparent samples
  • Highest optical resolution achievable (<200 nm) simultaneously with AFM
  • Highest efficiency of Raman / fluorescence Photon collection (with immersion optics) simultaneously with AFM
  • Probe scanning in addition to sample scanning (important for TERS)
  • Equipped with heating stage, temperature controlled liquid cell, environmental chamber, external magnet
  • Fits most commercial inverted microscopes, supporting advanced imaging modes
  • Optimized for opaque samples
  • Highest optical resolution (400 nm) simultaneously with AFM
  • Highest efficiency of Raman / fluorescence photon collection simultaneously with AFM
  • Beam scanning in addition to sample scanning (necessary for TERS)
  • Equipped with heating stage, liquid cell, environmental chamber
Can work with cantilevers (contact, intermittent contact and other modes: more than 30) and with metal tips (STM mode, shear force mode, normal force mode)
Confocal Raman/Fluorescence microscopy

Confocal Raman/Fluorescence/Rayleigh imaging runs simultaneously with AFM (during one sample scan)

Diffraction limited spatial resolution: <200 nm in XY, <500 nm in Z (with immersion objective)

True confocality; motorized confocal pinhole for optimal signal and confocality

Motorized variable beam expander/collimator: adjusts diameter and collimation of the laser beam individually for each laser and each objective used

Full 3D (XYZ) confocal imaging with powerful image analysis

Hyperspectral imaging (recording complete Raman spectrum in every point of 1D, 2D or 3D confocal scan) with further software analysis

Optical lithography (vector, raster)

AFM/STM: Integration with spectroscopy

Optical lithography (vector, raster)

Highest possible resolution (numerical aperture) optics is used simultaneously with AFM: 0.7 NA for Upright, 1.3–1.4 NA for Inverted
AFM/STM and confocal Raman/Fluorescence images are obtained simultaneously (during one scan)
All standard SPM imaging modes are supported (>30 modes) — combined with confocal Raman/Fluorescence
Low noise AFM/STM (atomic resolution)
Vibrations and thermal drifts originating from optical microscope body are minimized due to special design of optical AFM heads
Focus track feature: sample always stays in focus due to AFM Z-feedback; high quality confocal images of very rough or inclined samples can be obtained
Software

Seamless integration of AFM and Raman; all AFM/ Raman/SNOM experiment and further data analysis is performed in one and the same software

Powerful analysis of 1D, 2D and 3D hyperspectral images

Powerful export to other software (Excel, MatLab, Cytospec etc.)

Spectroscopy*

Extremely high efficiency 520 mm length spectrometer with 4 motorized gratings

Visible, UV and IR spectral ranges available

Echelle grating with ultrahigh dispersion; spectral resolution: 0.007 nm (< 0.1 1/cm)**

  • TE cooled (down to -100 oC) CCD camera. EMCCD camera is optional — for ultrafast imaging
  • Photon multiplier (PMT) or avalanche photodiode in photon counting mode
  • Photon multiplier for fast confocal laser (Rayleigh) imaging

Flexible motorized polarization optics in excitation and detection channels, cross-polarized Raman measurements

Fully automated switch between different lasers — with a few mouse clicks

000

Scanning Near Field Optical Microscopy (SNOM)

Two major SNOM techniques supported: (i) based on quartz fiber probes, (ii) based on silicon cantilever probes

All modes supported: Transmission, Collection, Reflection

All SNOM signals detected: laser intensity, fluorescence intensity, spectroscopy

SNOM lithography (vector, raster)

Optimized for Tip Enhanced Raman Scattering (TERS) and other tip-related optical techniques (S-SNOM, TEFS, STM-LE etc.)

All existing TERS geometries are available: illumination/ collection from bottom, from top or from side

Different SPM techniques and TERS probes can be used: STM, AFM cantilever, quartz tuning fork in tapping and shear force modes

Dual scan (for Hot Point Mapping in TERS): scan by sample AND scan by tip / by laser spot

Motorized polarization optics to produce optimal polarization for TERS

AFM-Raman measurements can run in air, in controlled atmosphere or in liquid — all with variable temperature

Some features listed are optional — not included into basic system configuration
* Some features listed are optional — not included into basic system configuration
** Exact value of spectral resolution highly depends on how “resolution” is defined
  • Graphen, carbon nanotubes and other carbon materials
  • Semiconductor devices
  • Nanotubes, nanowires, quantum dots and other nanoscale materials
  • Polymers
  • Optical device characterization: semiconductor lasers, optical fibers, waveguides, plasmonic devices
  • Investigation of cellular tissue, DNA, viruses and other biological objects
  • Chemical reaction control

Example of NTEGRA Spectra application: Confocal Laser / Raman / Fluorescence and AFM imaging of algal cell structure All images are obtained in the single experiment

01 02 03

Bright field image

Image size: 50x50 μm

Confocal laser (Rayleigh) image

Image size: 50x50 μm

AFM topography map

Image size: 50x50 μm

04 05
Confocal Raman map
(s-carotene band)
Image size: 25x25 μm
Confocal fluorescence map
Image size: 25x25 μm

 

01

Carbon nanotubes

AFM image, Raman spectra and 2D Raman maps of single-walled carbon nanotube material.Amorphous carbon is visualized in D-band (1351 cm-1) while well structured nanotubes are present in RBM-band (173 cm-1). Raman images size 5x5 μm. Images courtesy of Dr. Kudryashov, TII,Tokyo, Japan.

02

AFM working simultaneously with 400 nm resolution optics

"AFM + confocal microscope" with high magnification optics in upright configuration. Note extremely high imaging resolution of 100x objective as seen on 1 μm height characters on Si substrate (a). Due to the highnumerical aperture (0.7) of the objective, opaque silicon AFM probe looks "transparent" on the image.AFM scanning can be obtained simultaneously (b) with both direct and confocal optical images.Thanks to the additional beam scanning option, a tightly focused laser spot can be positioned exactly at the apex of the AFM probe — as required for TERS experiments.

03

 

Raman microscopy with Ultra-high spatial resolution
05

A — a specially prepared AFM probe (metal coated cantilever or etched metal wire) is precisely positioned inside a tightly focused laser spot. b — intensity of carbon nanotube G- and D- Raman bands increases by several orders of magnitude when the special AFM probe is landed and positioned over a small (5 nm height) nanotube bundle - the effect of Tip enhanced Raman scattering (TERS). c — "conventional" confocal Raman image of the nanotube bundle, the observed width of the bundle is ~250 nm (diffraction limit of confocal microscopy, laser wavelength - 633 nm). d — TERS image of the same bundle - now the observed width is ~70 nm. Note, in this example, TERS provides more than 4-times better spatial resolution as compared to confocal microscopy. Resolution down to 10 nm and less is theoretically possible.Measurements are done with NTEGRA Spectra in Inverted configuration. Data courtesy of Dr. S. Kharintsev, Dr. J. Loos, Dr. G. Hoffmann, Prof. G. de With, TUE, the Netherlands and Dr. P.Dorozhkin, NT-MDT Co.

 

Comprehensive analysis of biological structures
06
Algal cells visualization by different techniques. a — bright field overview, b — confocal Raman map at 1524 cm-1 (beta-carotene line), c — confocal image of autofluorescence at 492-513 nm, d — AFM image. Sample courtesy of Don McNaughton,Monash University,Victoria, Australia.
Light transport in nanostructures
Stress mapping in silicon structures
06 07
Fluorescent nanowire is excited by 488 nm light at the body (left image) and at the left end (right image). Excitation light is completely cut off from the image by two edge filters (with 10-6 transmission). Part of the fluorescence light emitted from nanowire (>10%) is transmitted through the nanowire and is emitted from nanowire ends. A — AFM topography of indentation in silicon substrate. b — Center of mass position shift of 520 cm-1 silicon line - proportional to stress distribution around the indentation. Spectral resolution: better then 0.1 cm-1

 

 

01
02
03
001 002 003
Upright
Inverted
Side illumination
04 05
Configuration with Renishaw spectrometer Configuration with NT-MDT spectrometer

 

螢幕 Video Monitor 十字線產生器 訊號傳輸線 訊號放大器單十字線產生器 雙十字線產生器 特殊Pattern產生器 超細十字線產生器 Camera Link Cable訊號放大器 Camera Link 訊號傳輸線彩色螢幕 黑白螢幕 彩色Monitor 黑白Monitor 耐撓曲訊號傳輸線 耐撓曲訊號線 耐撓折訊號傳輸線 耐撓折訊號線
     
 
Copyright © 2004 Power Assist Instrument Scientific Corp. All Right Reserved 
update: 2014-08-01